Here, Hugh Chipman, editor of Technometrics, highlights the featured articles that are included in the May issue, such as “Accessing Fingerprint Individuality Using EPIC: A Case Study in the Analysis of Spatially Dependent Marked Processes” and “Modeling Spectral-Temporal Data from Point Source Events.”
Technometrics Highlights
Analysis of Shape Experiments Featured in February Issue
In the featured article of the February issue, Enrique del Castillo and Bianca M. Colosimo consider a different kind of complex data: the geometric shape of an object.
Reliability Growth Metrics Featured in November Issue
The November issue of Technometrics features five articles focusing on reliability growth metrics.
Profile Monitoring Highlighted in August Issue
Here are the highlights to the August 2010 issue of Technometrics, which opens with the feature article “Nonparametric Profile Monitoring by Mixed Effects Modeling” by Peihua Qiu, Changliang Zou, and Zhaojun Wang.
