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You are here: Home / Member News / Section News / Quality and Productivity / Q&P Invites All to Fall Technical Conference

Q&P Invites All to Fall Technical Conference

August 1, 2011 Leave a Comment

Members of the Quality and Productivity Section (Q&P) invite you to attend this year’s Fall Technical Conference (FTC) in Kansas City, Missouri, from October 12–15. The conference is a premier forum in which to discuss topics at the interface of statistics and quality, leading to a more effective use of statistics to improve quality. The theme for this year is “Quality and Statistics: Getting Up to Date.” The program includes a range of talks about subjects such as experimental design, reliability analysis, data mining, and statistical process control. Highlights include a plenary address by Christopher J. Nachtsheim from the University of Minnesota and the W.J. Youden Memorial Address by William I. Notz from The Ohio State University.

The Q&P invited session on Bayesian reliability features William Q. Meeker from Iowa State University, who will give a talk titled “The Cautious Use of Bayesian Methods in Reliability Analysis,” and Kenneth J. Ryan from Bowling Green State University, who will give a talk titled “A Bayesian Hierarchical Power Law Process Model for Multiple Repairable Systems with an Application to Supercomputer Reliability.”

Q&P also is sponsoring a short course on October 15, titled “Introduction to R,” which will be taught by Garrett Grolemund. This course will cover the basics of R, as well as how to clean, visualize, and model data with R. No prior R experience is assumed. The course builds mastery in common data handling and analysis tasks and will include hands-on exercises.

For more information and the complete program, visit the conference website.

Filed Under: Quality and Productivity, Section News Tagged With: Fall Technical Conference, Quality and Productivity, R, register, short course

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