Quality and Productivity Research Conference

This year, the 32nd Quality and Productivity Research Conference (QPRC) sponsored by Q&P was held at the College of Textiles, North Carolina State University, June 10–12. On June 9, Q&P offered a short course, titled “Experiences and Pitfalls in Reliability Data Analysis and Test Planning,” instructed by William Q. Meeker of Iowa State University. This short course presented the analyses of many life data analysis applications in product reliability and materials evaluation. The analyses illustrated the use of a mix of proven traditional techniques, enhanced and brought up to date with modern computer-based methodology. Methods used in the analyses included nonparametric estimation, probability plotting, maximum likelihood estimation of parametric models, analysis of data with multiple failure modes, likelihood-based confidence intervals, acceleration models, accelerated life testing, Bayesian methods, accelerated degradation testing, and the analysis of recurrence data from repairable systems.

Fall Technical Conference

The 59th annual Fall Technical Conference (FTC) will take place October 8–9 in Houston, Texas. On October 7, Q&P will sponsor a short course, titled “Split-Plot Design and Analysis,” instructed by Peter Goos of the University of Antwerp and Erasmus University Rotterdam. This course provides a thorough introduction to the design of split-plot experiments, the evaluation of split-plot experimental designs, and the analysis of data from split-plot experiments. Extensions to the split-plot design such as the strip-plot design and split-split-plot design are discussed, as well. The course emphasizes industrial applications, involving full and fractional factorial two-level designs and response surface designs, and uses a regression approach to the data analysis. Based on the insights acquired concerning the data analysis, a flexible approach to the design of split-plot (and related) experiments is introduced. Throughout, various diagnostic tools will be used to evaluate the quality of alternative design options. The importance of simulating data will be highlighted. Registration is open for both the short course and conference.