Here, Hugh Chipman, editor of Technometrics, highlights the featured articles that are included in the May issue, such as “Accessing Fingerprint Individuality Using EPIC: A Case Study in the Analysis of Spatially Dependent Marked Processes” and “Modeling Spectral-Temporal Data from Point Source Events.”

In the featured article of the February issue, Enrique del Castillo and Bianca M. Colosimo consider a different kind of complex data: the geometric shape of an object.

The November issue of Technometrics features five articles focusing on reliability growth metrics.

Here are the highlights to the August 2010 issue of Technometrics, which opens with the feature article “Nonparametric Profile Monitoring by Mixed Effects Modeling” by Peihua Qiu, Changliang Zou, and Zhaojun Wang.

Advances in applied reliability are a primary topic in the May 2010 issue of Technometrics. Here are the highlights.

The February 2010 special issue of Technometrics features several articles detailing some of the fascinating applications in which statistical data analysis is used to detect unusual circumstances, or anomalies.

The November 2009 issue of Technometrics is a special collection of articles on statistical problems that arise in computer modeling. The stimulus for this issue was a focus year on the topic held in 2006–2007 at the Statistical and Applied Mathematical Sciences Institute.

The August issue of Technometrics includes 10 articles that cover a broad range of topics, including forecasting, reliability, design of experiments, computer experiments, automatic control, regression, and measurement.