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Schoen Wins Lloyd S. Nelson Award

1 November 2011 No Comment

The American Society for Quality (ASQ) Statistics Division awarded Eric D. Schoen the 2011 Lloyd S. Nelson Award for his paper, “Optimum Designs Versus Orthogonal Arrays for Main Effects and Two-Factor Interactions,” published in the April 2010 issue of the Journal of Quality Technology (JQT). This award, created in honor of the founding JQT editor, recognizes the JQT article from the previous year of “greatest immediate impact to practitioners.”

Schoen is a guest professor in the department of environment and technology management at the University of Antwerp, Belgium, and a senior statistical consultant at the Research Group Quality and Safety, TNO, Zeist, the Netherlands.

In his award-winning paper, Schoen provides useful and practical guidance for choosing between orthogonal arrays and optimum designs that permit estimation of a full model. For illustration, he uses a real-life example from a wood construction application.

Schoen received his award at the ASQ and ASA jointly sponsored Fall Technical Conference in Kansas City, Missouri. His paper was selected based on a careful study of all the papers that appeared in JQT in 2010 by the award committee: Necip Doganaksoy (chair), Bill Meeker, Bob Mitchell, Bob Perry, and Frank Rossi.

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